◆ Refereed Journal ◆
Research Record TOP
2021年
- T. Mizuno, R. Kanazawa, K. Yamamoto, K. Murakawa, K. Yoshimizu, M. Tanaka, T. Aoki, and T. Sameshima : "Group-IV-semiconductor quantum-dots in thermal SiO2 layer fabricatedby hot-ion implantation technique: different wavelength photon emissions", Jpn. J. Appl. Phys. 60, (2021) SBBK08-1-11.
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2020年
- T. SAMESHIMA, T. NAGAO, E. SEKIGUCHI, AND M. HASUMI : "Argon Precursor Ion Implantation Used to Activate Boron Atoms in Silicon at Low Temperatures", IEEE Access 8 (2020) 72598-72606.
- T. Mizuno, R. Kanazawa, T. Aoki, and T. Sameshima : "SiC quantum dot formation in SiO2 layer using double hot-Si+/C+-ion implantation technique", Jpn. J. Appl. Phys. 59, (2020) SGGH02-1-12.
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2019年
- T. Sameshima, T. Kikuchi, T. Uehara, T. Arima, M. Hasumi, T. Miyazaki, G. Kobayashi, and I. Serizawa : "MICROWAVE RAPID HEATING SYSTEM USING CARBON HEATING TUBE", AMPERE 2019, (2019) 318-325.
- T. Mizuno, M. Yamamoto, S. Nakada, S. Irie, T. Aoki, and T. Sameshima : "SiC nano-dot formation in bulk-Si substrate using hot-C+-ion implantation process", Jpn. J. Appl. Phys. 58, (2019) 081004-1-12.
- T. Sameshima, T. Miyazaki, G. Kobayashi, T. Arima, T. KIKUCHI, T. Uehara, T. Sugawara, M. Hasumi and I. Serizawa: "Carbon Heating Tube Used for Rapid Heating System", IEEE Access 7 (2019) 23798-23805.
- T. Mizuno, R. Kanazawa, T. Aoki, and T. Sameshima: "SiC nanodot formation in amorphous-Si and poly-Si substrates using a hot-C+-ion implantation techniqu", Jpn. J. Appl. Phys. 58, (2019) SBBJ01-1-10.
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2018年
- M. Hasumi, Y. Ogawa, K. Oshinari, J. Shirakashi, W. Kubo and T. Sameshima: "Reduction in connecting resistivity and optical reflection loss at intermediate layer for mechanically stacked multijunction solar cells", Jpn. J. Appl. Phys. 57 (2018) 102301-1-6.
- T. Sameshima, Y. Ogawa, and M. Hasumi: "Reduction in optical reflection at intermediateadhesive layer for mechanically stacked multijunction solar cells", Advanced Materials Proceedings 3 (2018) 361-365.
- T. Sameshima, K. Yasuta, M. Hasumi, T. Nagao, and Y. Inouchi: "Activation of dopant in silicon by ion implantation under heating sample at 200 °C", Appl. Phys. A 124 (2018) 228-1-6.
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2017年
- T. Mizuno, T. Nimura, Y. Omata, Y. Nagamine, T. Aoki, and T. Sameshima: "Material structure of two-/three-dimensional Si-C layers fabricated by hot-C+-ion implantation into Si-on-insulator substrate", Jpn. J. Appl. Phys. 56 (2017) 04CB03-1-8.
- T. Sameshima, T. Nimura, T. Sugawara, Y. Ogawa, S. Yoshidomi, S. Kimura, and M. Hasumi: "Indium gallium zinc oxide layer used to decrease optical reflection loss at intermediate adhesive region for fabricating mechanical stacked multijunction solar cells", Jpn. J. Appl. Phys. 56 (2017) 012602-1-7.
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2016年
- S. Kimura, K. Ota, M. Hasumi, A. Suzuki, M. Ushijima, and T. Sameshima: "Crystallization and activation of silicon by microwave rapid annealing", Appl. Phys. A. 122 (2016) 695-1-9.
- T. Nakamura, T. Motoki, J. Ubukata, T. Sameshima, M. Hasumi and T. Mizuno: "Heat treatment in 110oC liquid water used for passivating siliconsurfaces", Appl. Phys. A. 122 (2016) 440-1-8.
- T. Mizuno, Y. Nagamine, Y. Omata, Y. Suzuki, W. Urayama, T. Aoki, and T. Sameshima: "C-atom-induced bandgap modulation in two-dimensional (100) silicon carbon alloys", Jpn. J. Appl. Phys. 55 (2016) 04EB02-1-8.
- T. Sameshima and M. Hasumi: "Behavior of Photo Induced Minority Carrier Lifetime in PN Junction
with Different Bias Voltages", Energy Procedia 84 (2015) 110-117.
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2015年
- S. Yoshidomi, S. Kimura, M. Hasumi, and T. Sameshima: "Indium-gallium-zinc-oxide layer used to increase light transmittance efficiency of adhesive layer for stacked-type multijunction solar cells", Jpn. J. Appl. Phys. 54 (2015) 112301-1-5.
- T. Nakamura, T. Sameshima, M. Hasumi, and T. Mizuno: "Passivation of silicon surfaces by heat treatment in liquid water at 110oC", Jpn. J. Appl. Phys. 54 (2015) 106503-1-7.
- T. Sameshima, T. Motoki, K. Yasuda, T. Nakamura, M. Hasumi, and T. Mizuno: "Photoinduced carrier annihilation in silicon pn junction", Jpn. J. Appl. Phys. 54 (2015) 081302-1-6.
- T. Mizuno, Y. Nagamine, Y. Suzuki, Y. Nakahara, Y. Nagata. T. Aoki and T. Sameshima: "Impurity doping effects on impurity band structure modulationin two-dimensional n+ and p+ Si layers for future CMOS devices", Jpn. J. Appl. Phys. 54 (2015) 04DC05-1-6.
- T. Sameshima, M. Hasumi, and T. Mizuno: "Laser annealing of plasma-damaged silicon surface", Applied Surface Science, 336 (2015) 73-78.
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2014年
- S. Yoshidomi, J. Furukawa, M. Hasumi and T. Sameshima: "Mechanical Stacking Multi Junction Solar Cells Using Transparent
Conductive Adhesive", Energy Procedia 60 (2014) 116-122.
- H. Abe, C. Akiyama, M. Hasumi, T. Sameshima, T. Mizuno, and N. Sano: "Passivation of Silicon Surface by Laser Rapid Heating", Journal of Laser Micro/Nanoengineering. 9 (2014) 143-146.
- T. Sameshima and S. Shibata: "Annihilation of photo induced minority carrier caused by ion implantation and rapid thermal annealing", Jpn. J. Appl. Phys. 53 (2014) 061301-1-6.
- T. Sameshima, H. Nomura, S. Yoshidomi, and M. Hasumi: "Multi junction solar cells using band-gap induced cascaded light absorption", Jpn. J. Appl. Phys. 53 (2014) 05FV07-1-4.
- M. Hasumi, T. Nakamura, S. Yoshidomi, and T. Sameshima: "Activation of silicon implanted with phosphorus and boron atoms by microwave annealing with carbon powder as a heat source", Jpn. J. Appl. Phys. 53 (2014) 05FV05-1-6.
- S. Yoshidomi, M. Hasumi, T. Sameshima: "Investigation of conductivity of adhesive layer including indium tin oxide particles for multi-junction solar cells", Appl. Phys. A. 116 (2014) 2113-2118
- T. Mizuno, Y. Nagata, Y. Suzuki, Y. Nakahara, Y. Nagamine, K. Saita, T. Aoki and T. Sameshima: "Crystal direction dependence of quantum confinement effects of two-dimensional Si layers fabricated on silicon-on-quartz substrates: modulation of phonon spectra and energy band structures", Jpn. J. Appl. Phys. 53 (2014) 04EC09-1-6.
- T. Mizuno, Y. Nakahara, Y. Nagata, Y. Suzuki, T. Aoki and T. Sameshima: "Quantum confinement effects in doped two-dimensional Si layers: Novel device design for two-dimensional pn-junction structures", Jpn. J. Appl. Phys. 53 (2014) 04EC08-1-7.
- T. Sameshima, J. Furukawa, T. Nakamura, S. Shigeno, T. Node, S. Yoshudomi, and M. Hasumi: "Photo induced minority carrier annihilation at crystalline silicon surface in metal oxide semiconductor structure", Jpn. J. Appl. Phys. 53 (2014) 031301-1-6.
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2013年
- T. Mizuno, T. Aoki, Y. Nagata, Y. Nakahara, and T. Sameshima: "Experimental Study on Surface-Orientation/Strain Dependence of Phonon Confinement Effects and Band Structure Modulation in Two-Dimensional Si Layers", Jpn. J. Appl. Phys. 52 (2013) 04CC13-1-8.
- T. Sameshima, J. Furukawa, and S. Yoshidomi: "Minority Carrier Annihilation in Lateral Direction Caused by Recombination Defects at Cut Edges and Bear Surfaces of Crystalline Silicon", Jpn. J. Appl. Phys. 52 (2013) 041303-1-6.
- T. Sameshima, R. Ebina, K. Bestuin, Y. Takiguchi, and M. Hasumi: "Investigation of Silicon Surface Passivation by Microwave Annealing Using Multiple-Wavelength Light-Induced Carrier Lifetime Measurement", Jpn. J. Appl. Phys 52 (2013) 011801-1-6.
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2012年
- T. Sameshima, K. Betsuin, T. Mizuno and N. Sano: "Minority Carrier Lifetime Behavior in Crystalline Silicon in Rapid Laser Heating", Jpn. J. Appl. Phys. 51 (2012)03CA04-1-6.
- T. Sameshima, T. Nagao, M. Hasumi, A.Shuku, E.Takahashi and Y. Andoh: "Surface Passivation of Crystalline Silicon by Combination of Amorphous Silicon Deposition with High-Pressure H2O Vapor Heat Treatment", Jpn. J. Appl. Phys 51 (2012) 03CA06-1-6.
- T. Sameshima, Y. Kanda , M. Hasumi, J. Tatemichi, Y. Inouchi, M. Naito: "Laser Induced Formation of Buried Void Layer in Silicon ", J. Laser Micro/Nanoengineering, 7(2012) 93-96.
- T. Mizuno, K. Tobe, Y. Maruyama, and T. Sameshima: "Experimental Study of Silicon Monolayers for Future Extremely Thin Silicon-on-Insulator Devices: Phonon/Band Structures Modulation Due to Quantum Confinement Effects", Jpn. J. Appl. Phys. 51 (2012) 02BC03-1-8.
- T. Sameshima and M. Hasumi: " Infrared semiconductor laser irradiation used for crystallization of silicon thin films", J. of Non-Crystalline Solids 358 (2012) 2162-2165.
- J. Takenezawa, M. Hasumi, T. Sameshima, T. Koida, T. Kaneko, M. Karasawa, and M. Kondo: "Heat Treatment of Amorphous Silicon p-i-n Solar Cells with High-Pressure H2O Vapor", J. of Non-Crystalline Solids 358 (2012) 2285-2288.
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2011年
- T. Sameshima, J. Takenezawa, M. Hasumi, T. Koida, T. Kaneko, M. Karasawa and M. Kondo, "Multi Junction Solar Cells Stacked with Transparent and Conductive Adhesive", Jpn. J.Appl. Phys. 50 (2011) 052301-1-4.
- T. Sameshima, T. Nagao, S. Yoshidomi, K. Kogure and M. Hasumi, "Minority Carrier Lifetime Measurements by Photo-Induced Carrier Microwave Absorption Method", Jpn. J.Appl. Phys. 50 (2011) 03CA02-1-8.
- M. Hasumi, J. Takenezawa, T. Nagao and T. Sameshima, "Characterization of Plasma-Irradiated SiO2/Si Interface Properties by Photoinduced-Carrier Microwave Absorption Method",Jpn. J.Appl. Phys. 50 (2011) 03CA03-1-5.
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2010年
- T. Sameshima, K. Kogure and M. Hasumi, "Crystalline Silicon Solar Cells with Two Different Metals", Jpn. J.Appl. Phys. 49 (2010) 110205-1-3.
- K. Ukawa, Y. Kanda, T. Sameshima, N. Sano, M. Naito and N. Hamamoto, "Activation of Silicon Implanted with Phosphorus and Boron Atoms by Infrared Semiconductor Laser Rapid Annealing", Jpn. J.Appl. Phys. 49 (2010) 076503-1-7.
- T. Mizuno, N. Mizoguchi, K. Tanimoto, T. Yamauchi, M. Hasegawa, T. Sameshima, and T. Tezuka, "New Source Heterojunction Structures with Relaxed/Strained Semiconductors for Quasi-Ballistic Complementary Metal-Oxide-Semiconductor Transistors: Relaxation Technique of Strained Substratesand Design of Sub-10 nm Devices", Jpn. J.Appl. Phys. 49 (2010) 04DC13-1-7.
- T. Sameshima, Y. Mizutani, K. Motai and K. Ichimura, "Defect Reduction in Polycrystalline Silicon Thin Films at 150oC", Jpn. J.Appl. Phys. 49 (2010) 03CA02-1-4.
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2009年
- T. Sameshima, K. Kogure, S. Yoshidomi, T. Haba, M. Hasumi and N. Sano, "Crystallization of Silicon Thin Films by Infrared Semiconductor Laser Irradiation Using Carbon Particles", Journal of Laser Micro/Nanoengineering. 4 (2009) 227-230.
- T. Sameshima, H. Hayasaka, and T. Haba, "Analysis of Microwave Absorption Caused by Free Carriers in Silicon", Jpn. J.Appl. Phys. 48 (2009) 021204-1-6.
- T. Sameshima, "Laser Crystallization for Large Area Electronics", Appl. Phys. 96 (2009) pp137-144. (invited)
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2008年
- Y.Urabe, T. Ssmeshima K. Motai and K. Ichimura "Improvement in SiO2 Film Properties Formed by Sputtering Method at 150oC", Jpn. J.Appl. Phys. 47 (2008) 8003-8006
- T. Sameshima, Y. Matsuda, Y. Andoh, and N. Sano, "Recrystallization behavior of silicon implanted with phosphorus atoms by infrared semiconductor laser annealing", Jpn. J.Appl. Phys. 47 (2008) 1871-1875
- K. Yoshioka, T. Sameshima and N. Sano, "Progress in Fabrication Processing of Thin Film Transistors", Solid-State Electronics 52 (2008)359-364.
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2007年
- K. Yoshioka, T. Sameshima, T. Iwasaki, and K. Takechi, "Forward Transfer of Thin-Film Devices to Flexible Substrates by Applying Thermal Stress", Jpn. J.Appl. Phys. 46 (2007) 6469-6473.
- T. Sameshima, M. Maki, M. Takiuchi, N. Andoh, N. Sano, Y. Matsuda and Y. Andoh "Activation of Silicon Implanted with Phosphorus Atoms by Infrared Semiconductor Laser Annealing", Jpn. J.Appl. Phys. 46 (2007) 6474-6479.
- N. Sano, M. Maki, N. Andoh and T. Sameshima, Y. Matsuda, and Y. Andoh, "Activation of Implanted Boron Atoms in Silicon Wafers by Infrared Semiconductor Laser Annealing Using Carbon Films as Optical Absorption Layers", Jpn. J.Appl. Phys. 46 (2007) L620-L622.
- N. Sano, M. Maki, N. Andoh and T. Sameshima, "Infrared Semiconductor Laser Crystallization of Silicon Thin Films
Using Diamond-Like Carbon as Photoabsorption Layer", Jpn. J.Appl. Phys. 46 (2007) 1254-1257.
- T. Sameshima, H. Hsyasaka, M. Maki, A. Masuda, T. Matsui, and M. Kondo, "Defect Reduction in Polycrystalline Silicon Thin Films by Heat Treatment with High-Pressure H2O Vapor", Jpn. J.Appl. Phys. 46 (2007) 1286-1289.
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2006年
- H. Watakabe, T. Sameshima, H. Kanno, M. Miyao, "Electrical properties for poly-Ge films fabricated by pulsed laser annealing", Thin Solid films 508 (2006) 315-317.
- Punchaipetch, M. Miyashita, Y. Uraoka, T. Fuyuki, T. Sameshima and S. Horii, "Improving high-κ gate dielectrics properties by high pressure water vapor annealing", Jpn. J.Appl. Phys. 45 (2006) L120-L123.
- T. Sameshima and M. Kimura, "Characterization of Polycrystalline Silicon Thin-Film Transistors", Jpn. J.Appl. Phys. 45 (2006) 1534-1539.
- T. Sameshima, H. Watakabe, N. Andoh and S. Higashi,"Pulsed Laser Annealing of Thin Silicon Films", Jpn. J.Appl. Phys. 45 (2006) 2437-2440.
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2005年
- H. Watakabe, T. Sameshima, T. Strutz, T. Oitome and A. Kohno,"Defect Reduction Treatment for Plasma-TEOS-SiO2 by High Pressure H2O Vapor Heat Treatment", Jpn. J.Appl. Phys. 44 (2005) 8367-8370.
- T. Sameshima and N. Andoh, "Heating Layer of Diamond Like Carbon Films Used for Crystallization of Silicon Films", Jpn. J.Appl. Phys. 44 (2005)7305-7308.
- T. Sameshima, K. Yoshioka and K. Takechi, "Germanium Oxide Layers Used for Forward Transfer of Electrical Circuits to Foreign Plastic Substrates", Jpn. J.Appl. Phys. 44(2005)6421-6424.
- T. Sameshima, "Progress in fabrication technologies of polycrystalline-silicon thin-film transistors at low temperatures", J. Soc. Inf. Display 13 (2005) p233-239.
- T. Sameshima, N. Andoh and Y. Andoh, "Activation Behavior of Boron and Phosphorus Atoms Implanted in Polycrystalline Silicon Films by Heat Treatment at 250 oC", Jpn. J.Appl. Phys. 44 (2005) 1186-1191.
- N. Andoh, T. Sameshima and Y. Andoh, "Activation of Boron and Phosphorus Atoms implanted in Polycrystalline Silicon Films at Low Temperatures", Thin Solid films 487 (2005) 252-254.
- N. Andoh, T. Sameshima and K. Kitahara, "Crystallization of silicon films by rapid joule heating method", Thin Solid films 487 (2005) 118-121.
- T. Sameshima, H.Watakabe, N. Andoh and S. Higashi, "Pulsed Laser Crystallization of Very Thin Silicon Films", Thin Solid films 487 (2005) 63-66.
- T. Sameshima, H.Watakabe, and H. Kanno, T. Sadoh, M.Miyao,"Pulsed Laser Crystallization of Silicon-Germanium Films", Thin Solid films 487 (2005) 67-71.
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2004年
- H. Watakabe and T. Sameshima, H. Kanno, T. Sadoh and M. Miyao, "Electrical and structural properties of poly-SiGe film formed by pulsed laser annealing", J. Appl. Phys. 95 (2004) 6457-6461.
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T. Sameshima, K. Motai, and N. Andoh, "Characterization of Polycrystalline Silicon Thin Films Fabricated by Rapid Joule Heating Method ", Appl. Phys. A79 (2004) 599-603.
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2003年
- Y. Kaneko N. Andoh and T. Sameshima, " Polycrystalline Silicon Thin Film Transistors Fabricated by Rapid Joule Heating Method”, IEEE Electron Device Letters 24 (2003)586-588.
- T. Sameshima, Y. Kaneko and N. Andoh, " Application of Rapid Joule Heating Method to Fabrication of Polycrystalline Silicon Thin Film Transistors", Jpn. J.Appl. Phys. 42 (2003)5461-5464.
- H. Watakabe, T. Sameshima, " Oxygen plasma and high pressure H2O vapor heat treatments used to fabricate polycrystalline silicon thin film transistors ", Appl. Phys. A77 (2003) 141-144.
- T. Kamiya, T. Sameshima H. Mizuta, Y. Furuta, "Reduction of grain-boundary potential barrier height in polycrystalline silicon with hot H2O-vapor annealing probed using point-contact devices ", Z.A.K. Durrani, J. Vac. Sci. Technol. B 21 (2003) 1000-1003.
- T. Watanabe, H. Watakabe, K. Asada, T. Sameshima and M. Miyasaka, " Electrical Structural Properties of Solid Phase Crystallized Polycrystalline Silicon films and Their Improvements ", Appl. Phys. A77 (2003) 87-92.
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2002年
- 安藤伸行、大北圭介、鮫島俊之, "電流加熱結晶化法によるシリコン薄膜の結晶化",電子情報通信学会論文誌 C Vol. J85-C No. 8, (2002) 639-643.
- H. Watakabe and T. Sameshima, "Polycrystalline Silicon Thin FilmTransistors Fabricated by Defect Reduction Methods", IEEE Trans. Electron device 49 (2002) 2217- 2221.
- Y. Kaneko N. Andoh and T. Sameshima, "Rapid Joule Heating of Metal Films Used to Fabricate Polycrystalline Thin Film Transistors", Jpn. J. Appl. Phys. 41(2002) L913-915.
- H. Watakabe and T. Sameshima, "High Pressure H2O vapor Heat treatment Used to Fabricate Poly-Si Thin Film Transistors", Jpn. J. Appl. Phys. 41(2002) L974-977.
- N. Andoh and T. Sameshima, "Crystalline Grain Growth in the Lateral Direction for Silicon Thin Films by Electrical Current-Induced Joule Heating", Jpn. J. Appl. Phys. 41 (2002) 5513-5516.
- T. Sameshima, Y.Kaneko and N. Andoh, "Rapid Joule Heating of Metal Films Used to Crystallize Silicon Films", Appl.Phys.A74 (2002) 719-723 (invited).
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T. Sameshima, Y. Kaneko and N. Andoh, "Rapid Crystallization of Silicon Films Using Pulsed Current-Induced Joule Heating", J. of Non-Crystalline Solids 299-302 (2002) 746-750.
- H. Watakabe, Y. Tsunoda, N. Andoh and T. Sameshima, "Characterization and Control of Defect States of Polycrystalline Silicon Thin Film Transistor Fabricated by Laser Crystallization", J. of Non-Crystalline Solids 299-302 (2002)1321-1325.
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2001年
- T. Kamiya, A. Suemasu, T. Watanabe, T. Sameshima and I. Shimizu, "Improvement of Transport Properties for Polycrystalline Silicon Prepared by Plasma-Enhanced Chemical Vapor Deposition", Appl.Phys.A73 (2001)151-159.
- M. Kimura, S. Inoue, T. Shimoda and T. Sameshima, "Device Simulation of Carrier Transport Through Grain Baundaries in Lightly Doped Polysilicon Films and Dependence on Dopant Density", Jpn. J. Appl. Phys. 40 (2001) 5237-5243.
- T. Sameshima, Y. Kaneko and N. Andoh, "Rapid Crystallization of Silicon Films Using Joule Heating of Metal Films", Appl Phys. A 73 (2001) 419-423.
- S. Higashi and T. Sameshima, "Pulsed Laser Induced Microcrystallization and Amorphization of Silicon Thin Films", Jpn. J. Appl. Phys. 40 (2001) 480-485.
- M. Kimura, S. Inoue, T. Shimoda and T. Sameshima, "Device Simulation of Grain Boundaries in Lightly Doped Polysilicon Films and Analysis of Dependence on Defect Density", Jpn. J. Appl. Phys 40 (2001) 49-53.
- M. Kimura, S. Inoue, T. Shimoda and T. Sameshima, "Current Paths over Grain Boundaries in Polycrystalline Silicon Films", Jpn. J. Appl. Phys. 40 (2001)L97-99.
- T. Watanabe, T. Sameshima and M. Ide, "Etching of Buried Photoresist Layers and Its Application to Formation of Three Dimensional Layered Structure", Appl. Phys A 73 (2001) 429-432.
- T. Sameshima, N. Andoh and H. Takahashi, "Rapid Crystallization of Silicon Films Using Electrical-Current-Induced Joule Heating" , J. Appl. Phys. 89 (2001) 5362-5367.
- T. Sameshima and K. Ozaki, "Crystallization of Silicon Thin Films by Current- Induced Joule Heating", Appl. Surface Science 383 (2001) 107-109.
- T. Watanabe, T. Sameshima, "Free Carrier Optical Absorption used to Analyze the Electrical Properties of Polycrystalline Silicon Films Formed by Plasma Enhanced Chemical Vapor Deposition", Appl. Surface Science 383 (2001) 248-250
- N. Andoh, K. Hayashi, T. Shirasawa, T. Sameshima and K. Kamisako, "Effect of Film Thickness on Electrical Property of microcrystalline silicon films", Solar Energy Materials & Solar Cells 66(2001)437-441.
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N. Andoh, K. Kamisako, T. Sameshima and T. Saitoh, "Epitaxial Growth of Polycrystalline Films Formed by Microwave Plasma Chemical Vapor Deposition at Low Temperatures", Solar Energy Materials &Solar Cells 66 (2001)431-435.
- T. Sameshima, K. Sakamoto, K. Asada, M. Kondo, A. Matsuda and S. Higashi, "Reduction of Defects of Polycrystalline Thin Films by Heat Treatment with High Pressure H2O Vapor", Solar Energy Materials & Solar Cells 65 (2001)577-583.
- S. Ishigame, K. Ozaki, T. Sameshima and S. Higashi, "Characterization of Pulsed Laser Crystallization of Silicon Thin Film", Solar Energy Materials & Solar Cells 66 (2001)381-387.
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S. Sakamoto, K. Asada, T. Sameshima and T. Saitoh, "High-Pressure H2O Vapor Heating Used for Passivation of SiO2/Si Interfaces", Solar Energy Materials & Solar Cells 65 (2001) 571-576.
- S. Sakamoto, K. Asada and T. Sameshima, "Field Effect Surface Passivation of SiO2/Si Interfaces by Heat Treatment with High-Pressure H2O Vapor", Solar Energy Materials & Solar Cells 65 (2001)565-570.
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T. Sameshima, K. Saitoh, N. Aoyama, M. Tanda, M. Kondo, A. Matsuda and S. Higashi, "Analysis of Free Carrier Optical Absorption Used for Characterization of Microcrystalline Silicon Films", Solar Energy Materials & Solar Cells 66(2001)389-395.
- S. Higashi, N. Andoh, K. Kamisako and T. Sameshima, "Stress in Pulsed-Laser Crystallized Silicon Films", Jpn. J. Appl. Phys. 40(2001)731-735.
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2000年
- T. Sameshima, K. Ozaki and N. Andoh, "Large crystalline Grain Growth using Current-Induced Joule Heating", Applied Phys. A 71 (2000) 1-6.
- T. Sameshima, "Electronic and Crystallographic Properties of Polycrystalline Silicon Films", Asian J. of Phys. 9 (2000)771-795 (invited).
- T. Sameshima and K. Ozaki, "Current-Induced Joule Heating Used to Crystallize Silicon Thin Films", Jpn. J. Appl. Phys. 39 (2000) L651-L654
- T. Kamiya, K. Nakahata T. Sameshima, T. Watanabe, T. Mohri and I. Shimizu, "Free Carrier Optical Absorption and Hall Effect Current Measurements Used for Evaluation of Carrier Transport Properties of Polycrystalline Silicon Films with (220) and (400) Crystalline Orientation Structures", J. Appl. Phys. 88 (2000)3310-3315.
- K. Asada, K. Sakamoto, T. Watanabe, T. Sameshima and S. Higashi, "Heat treatment with High-Pressure H2O Vapor of Pulsed Laser Crystallized Silicon Films", Jpn. J. Appl. Phys. 39 (2000) 3883-3887.
- Y. Tsunoda, T. Sameshima and S. Higashi, "Improvement of Electrical Properties of Pulsed Laser Crystallized Silicon Films by Oxygen Plasma Treatment", Jpn. J. Appl. Phys. 39 (2000) 1656-1659
- K. Sakamoto and T. Sameshima, "Passivation of SiO2/Si interfaces using High-Pressure-H2O-Vapor Heating", Jpn. J. Appl. Phys. 39 (2000) 2492-2496.
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1999年
- S. Higashi, K. Ozaki, K. Sakamoto, Y. Kano and T. Sameshima, "Electrical Properties of Excimer Laser Crystallized Lightly Doped Polycrystalline Silicon Films", Jpn. J. Appl. Phys. 38(1999)L857-L860
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T. Sameshima, K. Sakamoto, K. Asada, "Defect Reduction and Surface Passivation of SiO2/Si by Heat Treatment with High-Pressure H2O Vapor", Applied Physics A 69(1999)221-224.
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T. Sameshima, K. Saitoh, N. Aoyama, S. Higashi, M. Kondo and A. Matsuda, "Electrical Properties of Pulsed Laser Crystallized Silicon Films", Jpn. J. Appl. Phys. 38(1999)1892-1897.
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1998年
- T. Sameshima, K. Sakamoto, Y. Tsunoda and T. Saitoh, "Improvement of SiO2 Properties and Silicon Surface Passivation by Heat Treatment with High-Pressure H2O Vapor", Jpn. J. Appl. Phys. 37(1998)L1452-1454
- T. Sameshima, M. Satoh, K. Sakamoto, K. Ozaki and K. Saitoh, "Improvement in Characteristics of Polycrystalline Silicon Thin-Film Transistors by Heating with High-Pressure H2O Vapor", Jpn. J.Appl. Phys.37 (1998)L1030-1032.
- T. Sameshima, M. Satoh, K. Sakamoto, K. Ozaki and K. Saitoh, "Heat Treatment of Amorphous and Polycrystalline Silicon Thin Films with High-Pressure H2O Vapor", Jpn. J. Appl. Phys. 37(1998)4254-4257.
- T. Sameshima, K. Sakamoto and M. Satoh, "Heat Treatment in High Pressure H2O Vapor Used for Improvement of Si-O Bonding Network Near SiO2/Si Interface", Thin Solid Films 335 (1998)138-141.
- T. Sameshima, M. Satoh, K. Sakamoto, A. Hisamatsu, K. Ozaki. and K. Saitoh, "Heat Treatment of Amorphous and Polycrystalline Silicon Thin Film with H2O Vapor", Jpn. J. Appl. Phys. 37(1998) L112-L114.
- T. Sameshima, "Status of Si Thin Film Transistors", J. of Non-Crystalline Solids 227-230(1998) 1196-1201. (invited)
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1997年
- T. Sameshima, K.Saitoh, M.Satoh, A.Tajima and N.Takashima, "Crystalline Properties of Laser Crystallized Silicon Films", Jpn. J. Appl. Phys. 36 (1997) L1360-L1363.
- T. Sameshima, T. Murakami, N.Takashima, A.Tajima and T.Mohri, " The Gas Combustion of H2 with N2O Used for Rapid Thermal Annealing", Jpn.J.Appl.Phys 37(1997) 6276-6279.
- T. Sameshima and M.Satoh, "Improvement of SiO2 Properties by Heating Treatment in High Pressure H2O Vapor", Jpn. J. Appl. Phys. 36 (1997) L687-L689.
- T. Sameshima, "Laser Processing for Thin Film Transistor Applications", Materials Science and Engineering B45 (1997) 186-193.
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1996年
- T. Sameshima and N.Takashima, "Optical Characterization of Laser-Induced Crystallized Silicon Films", Appl. Phys.A63 (1996)333-336.
- T. Sameshima Y. Sunaga N. Takashima and A. Tajima," Rapid Thermal Annealing Using the Combustion of H2 with N2O ", Appl. Phys. Lett. 69 (1996)1205-1207.
- T. Sameshima, "Laser beam application to Thin Film Transistors", Appl. Surface Science 96-98 (1996) 352-358.
- T. Sameshima, Y. Sunaga and A. Kohno, "Measurements of Temperature Distribution in Polycrystalline Thin Film Transistors Caused by Self- Heating", Jpn. J. Appl. Phys. Lett, 35 (1996) 308-310.
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1995年
- N. Sano, M. Sekiya, M. Hara, A. Kohno and T. Sameshima, "Improvement of SiO2/Si interface by low temeprature annealing in wet atmosphere", Appl. Phys. Letters. 66(1995)2107-2109.
- N. Sano, M. Sekiya, M. Hara, A. Kohno and T. Sameshima, "High Quality SiO2/Si Interfaces of Poly-Crystalline Silicon Thin Film Transistors by Annealing in Wet Atmosphere", IEEE Electron Device Letters 16 (1995)157-159.
- A. Kohno, T. Sameshima, N. Sano, M. Sekiya and M. Hara, "High Performance Poly-Si TFTs Fabricated Using Pulsed Laser Annealing and Remote Plasma CVD with Low Temperature Processing", IEEE Trans Electron Device 42 (1995)251-257.
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1979~1994年
- T. Sameshima, M. Sekiya, M. Hara, N. Sano and A. Kohno, "Reduction of defects in Laser-Induced Crystallized and Amorphized Silicon Films using Plasma Hydrogenation", J. Appl. Phys. 76 (1994) 7377-7383.
- N. Sano, K. Kohno, M. Hara, M. Sekiya and T. Sameshima, "A New Technique for Diagonistics of a Radio-Frequency Parallel-Plate Remote Plasma", Applied Phys. Lett. 65 (1994) 162-164.
- M. Sekiya, M. Hara , N. Sano, A. Kohno and T. Sameshima, "High Performance Poly-crystalline Silicon Thin Film Transistors Fabricated Using Remote Plasma Chemical Vapor Deposition of SiO2", IEEE Electron Device Letters, EDL-15 (1994) 69-71.
- T. Sameshima, A. Kohno, M. Sekiya, M. Hara and N. Sano, "Improvement of Gate-Insulator/Silicon Interface Characteristics in Amorphous Silicon Thin Film Transistors", Jpn. J. Appl. Phys.Lett. 33 (1994) 834-836.
- T. Sameshima, A. Kohno, M. Sekiya, M.Hara and N. Sano, "SiO2 Formation by Thermal Evaporation of SiO in Oxygen Atmosphere Used to Fabrication of High Performance Polycrystalline Silicon Thin Film Transistors", Appl. Phys. Lett. 64 (1994) 1018-1020.
- T. Sameshima, "Fabrication of poly-Si TFTs Using Laser Annealing Technique", Electronics and Communications in Japan (Scripta Technica, Inc., A John Wiley & Sons 1994) 76 (1993) 80.
- T. Sameshima and S. Usui, "Pulsed Laser-Induced Melting Followed by Quenching of Silicon Films", J. Appl. Phys. 74 (1993) 6592-6598.
- T. Sameshima, "Self Organized Grain Growth Larger than 1μm through Pulsed-Laser-Induced Melting of Silicon Films", Jpn. J. Appl. Phys. Lett. 32 (1993) 1485-1488.
- 鮫島俊之, "レーザアニール法を用いた薄膜トランジスタ作製技術", 電子情報通信学会論文誌C-II, J76-C-II (1993) 235-240. (invited)
- 鮫島俊之, "シリコン膜のレーザアモルファス化", 電気化学及び工業物理化学, 60 (1992)164.
- T. Sameshima and S.Usui, "Laser Beam Shaping System for Semiconductor Processing", Optics Communications 88 (1992) 59-62.
- T. Sameshima and S. Usui, "Mechanism of Pulsed Laser-Induced Amorphization of Silicon Films", Appl. Phys. Lett. 59 (1991) 2724-2726.
- T. Sameshima, M. Hara, N. Sano and S Usui, "Pulsed Laser-Induced Amorphization of Silicon Films",. J. Appl. Phys. 70 (1991) 1281-1289.
- T. Sameshima, M. Hara and S. Usui, "Observation of Laser-Induced Melting of Silicon Film Followed by Amorphization", Jpn. J. Appl. Phys. Lett. 29 (1990) 1363-1365.
- T. Sameshima, M. Hara and S. Usui, "Pulsed Laser-Induced Amorphization of Polycrystalline Silicon Film", Jpn. J. Appl. Phys. Lett. 29 (1990) 548-551.
- S. Usui, T. Sameshima and M. Hara, "The Transformation of a-Si:H into Polycrystalline Silicon by Excimer Laser Irradiation and Its Application to TFTs", Optoelectronics 1 (1989) 235-241.
- H. Tomita, M. Negishi, T. Sameshima and S. Usui, "Submicrometer Poly-Si CMOS Fabrication with Low-Temperature Laser Doping", IEEE Electron Device Lett., EDL-10 (1989) 547-549.
- T. Sameshima, M. Hara and S. Usui, "Measuring the Temperature of a Quartz Substrate during and after the Pulsed Laser-induced Crystallization of a-Si:H", Jpn. J. Appl. Phys. Lett. 28 (1989) 2131-2133.
- T. Sameshima, M. Hara and S. Usui, "XeCl Excimer Laser Annealing Used to Fabricate Poly-Si TFTs", Jpn. J. Appl. Phys. 28 (1989) 1789-1793.
- T. Sameshima, H.Tomita and S. Usui, "In Situ Observation of Pulsed Laser Doping", Jpn. J. Appl.Phys. Lett. 27 (1988) 1935-1937.
- T. Sameshima and S. Usui, "Analysis of Dopant Diffusion in Molten Silicon Induced by a Pulsed Excimer Laser", Jpn. J. Appl. Phys. Lett. 27 (1987)1208-1210.
- T. Sameshima, S. Usui and H. Tomita, "Fabrication of Heavily-Doped Polycrystalline Silicon Film Using a Laser-Doping Technique", Jpn. J. Appl. Phys. Lett. 26 (1987) 1678-1680.
- T. Sameshima, S. Usui and M. Sekiya, "Laser induced Melting of Predeposited Impurity Doping Technique used to Fabricate Shallow Junction", J. Appl. Phys. 62 (1987)711-713.
- T. Sameshima, S. Usui and M. Sekiya, "XeCl Excimer Laser Annealing Used in the Fabrication of Poly-Si TFTs", IEEE Electron Device Lett. EDL-7 (1986) 276-278.
- K. Inoue, N. Asai and T. Sameshima,."Experimental Study of the Hyper- Raman Scattering Due to Raman Ineactive Lattice Vibration in SrTiO3", J. Phys.Soc. Jpn 50 (1981) 1291-1300.
- K. Inoue, N. Asai and T. Sameshima, "Observation of the Phonon Polariton in the Centrosymmetric Crystal of SrTiO3 by Hyper Raman Scattering", J. Phys.Soc.Jpn. Lett 48 (1980) 1787-1789.
- K. Inoue and
T. Sameshima, "Observation of Hyper- Raman Scattering Spectra Due to Lattice Vibration in SrTiO3", J. Phys. Soc. Jpn. Lett. 47 (1979) 2037-2039. tanuki.
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